[1]方祥圣 梁华国 沈祝财.一种多核共享测试数据的BIST方案[J].计算机技术与发展,2006,(05):214-216.
FANG Xiang-sheng,LIANG Hua-guo,SHEN Zhu-cai.BIST Scheme for Test Data Sharing with Multiple Cores[J].,2006,(05):214-216.
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一种多核共享测试数据的BIST方案(
)
《计算机技术与发展》[ISSN:1006-6977/CN:61-1281/TN]
- 卷:
-
- 期数:
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2006年05期
- 页码:
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214-216
- 栏目:
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应用开发研究
- 出版日期:
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1900-01-01
文章信息/Info
- Title:
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BIST Scheme for Test Data Sharing with Multiple Cores
- 文章编号:
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1673-629X（2006）05-0214-03
- 作者:
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方祥圣1; 2 梁华国2 沈祝财2
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[1]安徽经济管理学院计算机系[2]合肥工业大学计算机与信息学院
- Author(s):
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FANG Xiang-sheng; LIANG Hua-guo; SHEN Zhu-cai
-
[1]Department of Computer, Anhui Economy Administer Institute[2]Institute of Computer and Information, Hefei University of Technology
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- 关键词:
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SOC芯片; 测试数据共享; BIST
- Keywords:
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SOC chip; test data sharing; BIST
- 分类号:
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TP301
- 文献标志码:
-
A
- 摘要:
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文中提出了一种新颍的SOC芯片BIST方案。该方案是利用相容技术和折叠技术，将SOC芯片中多个芯核的测试数据整体优化压缩和生成，并且能够实现多个芯核的并行测试，具有很高的压缩率，平均压缩率在94％以上；且结构简单、解压方便、硬件开销低，实验证明是一种非常好的SOC芯片的BIST方案
- Abstract:
-
Novel BIST scheme for SOC was presented in this paper. The test data of multiple cores was taken as one and optimization compressed and built by using compatible compreession and folding compression. Besides it could test multiple cores at one time. The compressibility is very high about 94%, as well as the structure is simpleness and decompression is convenience and the hardware consumption is low. The experiments show that this scheme is superduper for SOC BIST
备注/Memo
- 备注/Memo:
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国家自然科学基金资助项目（#90407008）;教育部留学回国人员科研基金资助项目（#2004.527）;安徽省自然科学基金资助项目（#050420103）方祥圣（1969-），男，安徽合肥人，硕士研究生。讲师，研究方向为内建式BIST、嵌入式系统的研究等；梁华国，教授，博导，研究方向为内建式BIST、数字系统设计自动化、ATPG算法与分布式控制等
更新日期/Last Update:
1900-01-01