[1]廖寅龙,田泽,赵强,等.软件与MBIST协同的片内SRAM测试方法研究[J].计算机技术与发展,2015,25(06):155-157.
　LIAO Yin-long,TIAN Ze,ZHAOQiang,et al. Research on SRAM Testing Integrated in SoC of Software and MBIST[J].,2015,25(06):155-157.
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软件与MBIST协同的片内SRAM测试方法研究()
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《计算机技术与发展》[ISSN:1006-6977/CN:61-1281/TN]

卷:
25
期数:
2015年06期
页码:
155-157
栏目:
应用开发研究
出版日期:
2015-06-10

文章信息/Info

Title:
 Research on SRAM Testing Integrated in SoC of Software and MBIST
文章编号:
1673-629X（2015)06-0155-03
作者:
 廖寅龙; 田泽; 赵强; 刘敏侠
 中航工业西安航空计算技术研究所
Author(s):
 LIAO Yin-long; TIAN Ze ; ZHAOQiang;  LIU Min-xia
关键词:
 ; SoC; 存储器内建自测试; 测试成本
Keywords:
 ; SoC; MBIST; test cost
分类号:
TP301
文献标志码:
A
摘要:
 随着SoC电路功能的日益复杂,SoC电路中大量应用了内嵌随机静态存储器,传统的通过MBIST(存储器内建自测试)方式对SoC电路中SRAM的测试,将给SoC电路带来功耗及管芯面积显著增大的问题；同时在传统MBIST方式下,SoC内嵌SRAM的测试严重依赖先进的ATE测试设备,需要付出昂贵的测试成本。文中提出一种软件与MBIST相协同的SRAM测试方法,利用SoC内嵌处理器运行特定算法软件的方式,实现SoC电路中大部分SRAM的测试,同时结合传统MBIT测试方式对其余内嵌处理器难以访问的SRAM进行测试,既实现了复杂SoC中内嵌SRAM测试的完备性,也很好地解决了测试完备性与测试成本的矛盾。
Abstract:
 With the development of IC, system-on-chip may have many SRAM blocks, the traditional testing method according to MBIST could not only increase the huge numbers of test logic,chip power consumption,but also tie the test to advanced ATE test ma-chine tightly which could also cost much. A kind of new SRAM test method by combining the software achievement and MBIST together is proposed to achieve the testing of SRAM integrated in SoC. The SRAM which could hardly be accessed by any other integrated pro-cessing units would also be tested by combing the traditional MBIT and the methods mentioned in this paper,not only achieving the test completeness of SRAM integrated in SoC,but also handling the conflict between full verification and cost.

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更新日期/Last Update: 2015-08-05